The AdMOS 3002A Flicker Noise System is a sophisticated solution for the analysis of noise effects of electronic components and systems in the low frequency range from 0.1Hz to 10MHz. It can measure the different noise types like 1/f noise, shot noise, thermal noise and random telegraph in the described frequency range.
The system consists of the 3012 Filter Unit, which should be placed as close as possible to the object to be measured to minimize interference from long supply lines and the 3023 Control Unit. The 3023 Control Unit has a state-of-the art integrated Dynamic Signal Analyzer (ADQ214-DCLN – Low-noise 14-bit Digitizer) which is especially designed for this type of measurement. In addition to an extended frequency range of 0.1Hz-10MHz, short measurement times and an exact resolution of the noise signals can be realized.
Furthermore, the control unit couples the measuring device to a Windows® PC on which the control software is installed.
Ready-to-use templates in the control software, which can be flexibly modified, allow the measurement of FETs (CMOS, HVMOS, OTFT, ..), bipolar transistors, diodes, resistors and other components on wafers or in packaged condition. Additionally, the noise behavior of entire circuits, such as amplifiers, can be tested.
The noise measurement system is designed to automatically determine the optimum setting for the highest accuracy of the noise measurement depending on the selected DC operating point of the DUT. This setting can be modified so that the focus is on higher throughput during measurement with reduced resolution.
An easy to use and intuitive software under Windows® is controlling the measurement system. In addition to the basic option for noise measurement, there are extensions for controlling a semi-automatic wafer probe station and for measuring the DC and capacitance-voltage behavior of components.